Emerson Launched Four-Port Vector Network Analyzer
The new hardware enables advanced multiport measurements for next-generation wireless testing systems.
Updated on Oct. 6, 2026 in Semiconductors
Live Poll
Do you believe rapid advancements in new consumer electronics technology improve your daily life?
Emerson has introduced the NI PXIe-5633, a four-port vector network analyzer, alongside software enhancements for the NI PXIe-5860 VST. These tools allow engineers to conduct S-parameter characterization and modulated RF measurements within a single architecture.
Why it matters
The new equipment addresses complex requirements for distributed architectures and multi-antenna wireless systems. By integrating these capabilities, the platform streamlines automated workflows from initial design validation through to final production.
The NI PXIe-5633 vector network analyzer features four ports to support multiport S-parameter measurements. It facilitates complex 4x4 MIMO test configurations within a single, unified software-driven platform.
The players
Emerson
Emerson is a global technology and engineering company that provides innovative solutions for customers in industrial, commercial, and residential markets.
European Microwave Week 2026
European Microwave Week is a prominent annual industry event that brings together professionals to discuss developments in microwave, RF, wireless, and radar technologies.
The details
The system architecture enables engineers to perform S-parameter characterization simultaneously with modulated RF measurements. This integration is designed to improve testing efficiency for multi-antenna wireless applications by consolidating multiple measurement types.
Timeline
Emerson debuted the products at European Microwave Week 2026 in October 2026.
The Tech Race
As wireless standards evolve toward more complex multi-antenna configurations, test instrumentation must pivot from legacy single-path setups to integrated, multiport architectures. This release positions Emerson to compete in the growing market for high-speed automated design validation.
Engineers and test technicians can now reduce system footprint and complexity by consolidating multiple RF measurement types onto one platform. This transition potentially accelerates development cycles for teams working on next-generation wireless device validation.
The takeaway
The addition of four-port testing capabilities highlights the industry shift toward highly integrated, software-defined measurement platforms. Professionals in RF development should consider how consolidated architectures can reduce the need for multiple discrete testing modules in their production lines.
Further reading
Learn more about the latest innovations in Semiconductors.
More information
Review the full NI PXI VNA and VST information for further technical documentation.
Live Poll
Do you believe rapid advancements in new consumer electronics technology improve your daily life?
